This paper describes how a micromachined, fiber-coupled, freestanding photoconductive probe is fabricated and then implemented to perform high temporal-, spatial-, and voltage-resolution measurements at the interior nodes of integrated circuits. This high-impedance, noninvasive probe has been utilized not only for temporal measurements of clocked microwave-digital ICs and nonlinear microwave circuits, but also to perform swept-frequency internal network measurements of MMICs. It has proven itself to be a valuable resource for isolating faults within circuits and for providing direct results that can be used for validating models and designs.


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    Titel :

    Advances in optically-based sampling for diagnostics of microwave digital and analog circuits


    Beteiligte:
    Whitaker, J.F. (Autor:in)


    Erscheinungsdatum :

    01.01.1999


    Format / Umfang :

    176994 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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