We present a 3D analysis of scattering losses due to sidewall roughness in rectangular dielectric waveguides valid for any refractive-index-contrast and field polarization. We show that the typical 2D analyses can substantially over-estimate scattering losses.


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    Title :

    3D Analysis of scattering losses due to sidewall roughness in microphotonic waveguides: high index-contrast


    Contributors:
    Barwicz, T. (author)


    Publication date :

    2005-01-01


    Size :

    2505397 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English





    Sidewall Roughness and Deformations in High Index-Contrast Waveguides and Photonic Crystals

    Lasers and Electro-optics Society (Institute of Electrical and Electronics Engineers) | British Library Conference Proceedings | 2004