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    Title :

    3-D Analysis of Scattering Losses Due to Sidewall Roughness in Microphotonic Waveguides: High Index-Contrast


    Contributors:
    Barwicz, T. (author)

    Conference:

    CONFERENCE, Lasers & electro-optics ; 2005 ; Baltimore, MD



    Publication date :

    2005-01-01


    Size :

    3 pages


    Remarks:

    IEEE cat. no. 05CH37634



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English






    Sidewall Roughness and Deformations in High Index-Contrast Waveguides and Photonic Crystals

    Lasers and Electro-optics Society (Institute of Electrical and Electronics Engineers) | British Library Conference Proceedings | 2004