We present a 3D analysis of scattering losses due to sidewall roughness in rectangular dielectric waveguides valid for any refractive-index-contrast and field polarization. We show that the typical 2D analyses can substantially over-estimate scattering losses.
3D Analysis of scattering losses due to sidewall roughness in microphotonic waveguides: high index-contrast
(CLEO). Conference on Lasers and Electro-Optics, 2005. ; 2 ; 1333-1335 Vol. 2
2005-01-01
2505397 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
British Library Conference Proceedings | 2005
|British Library Online Contents | 2005
|Sidewall Roughness and Deformations in High Index-Contrast Waveguides and Photonic Crystals
British Library Conference Proceedings | 2004
|