Design rules for low-loss waveguides with random perturbations are presented. For strip waveguides, the width should be chosen larger than 1/4 of the coherence length of the sidewall roughness. For an ensemble of perturbed 2D photonic crystal line defect waveguide bends, we give the statistics of the relative transmission.


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    Titel :

    Sidewall roughness and deformations in high index-contrast waveguides and photonic crystals


    Beteiligte:
    Poulton, C.G. (Autor:in) / Koos, C. (Autor:in) / Muller, M. (Autor:in) / Glockler, F. (Autor:in) / Wang, J. (Autor:in) / Fujii, M. (Autor:in) / Leuthold, J. (Autor:in) / Freude, W. (Autor:in)


    Erscheinungsdatum :

    2004-01-01


    Format / Umfang :

    142571 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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