We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer.
Determining thickness independently from optical constants using ultrafast spectral interferometry
(CLEO). Conference on Lasers and Electro-Optics, 2005. ; 2 ; 1103-1105 Vol. 2
2005-01-01
1307411 byte
Conference paper
Electronic Resource
English
Determining Thickness Independently from Optical Constants Using Ultrafast Spectral Interferometry
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