We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer.


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    Title :

    Determining thickness independently from optical constants using ultrafast spectral interferometry


    Contributors:
    Huang, F. (author) / Federici, J.F. (author) / Gary, D. (author) / Jedju, T. (author) / Warren, W.S. (author)


    Publication date :

    2005-01-01


    Size :

    1307411 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English




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