Determining Thickness Independently from Optical Constants Using Ultrafast Spectral Interferometry
CONFERENCE, Lasers & electro-optics ; 2005 ; Baltimore, MD
2005-01-01
3 pages
IEEE cat. no. 05CH37634
Conference paper
English
Lasers , Electro-optics , CLEO
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Measuring Ultrafast Optical Pulses Using Spectral Interferometry
British Library Online Contents | 1999
|Fiber diameter measurement using spectral interferometry
IEEE | 2003
|Monitoring the optical thickness of transparency films by homodyne interferometry
British Library Conference Proceedings | 1996
|