We have proposed and developed "terahertz ellipsometry" in which ellipsometry is applied to time-domain spectroscopy in the THz frequency region. In this paper, the complex optical constants of highly doped semiconductors obtained by terahertz ellipsometry are shown. In addition, the incident angle dependence of the measurement precision is discussed.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Measurement of complex optical constant using terahertz ellipsometry


    Contributors:
    Nagashima, T. (author) / Hangyo, M. (author)


    Publication date :

    2002-01-01


    Size :

    121269 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English