The polarization dependence of reflection-mode SNOM observation is characterized. An Al/glass grating with a fine structure is observed by SNOM. SNOM images observed with parallel- and perpendicular-polarized light show different feature each other. The difference is also studied by means of computer simulations.


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    Title :

    Effects of optical polarization in reflection-mode near-field optical microscopy


    Contributors:
    Sasagawa, K. (author) / Yoshida, H. (author) / Tokuda, T. (author) / Ohta, J. (author) / Nunoshita, M. (author)


    Publication date :

    2001-01-01


    Size :

    170068 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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