The polarization dependence of reflection-mode SNOM observation is characterized. An Al/glass grating with a fine structure is observed by SNOM. SNOM images observed with parallel- and perpendicular-polarized light show different feature each other. The difference is also studied by means of computer simulations.


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    Titel :

    Effects of optical polarization in reflection-mode near-field optical microscopy


    Beteiligte:
    Sasagawa, K. (Autor:in) / Yoshida, H. (Autor:in) / Tokuda, T. (Autor:in) / Ohta, J. (Autor:in) / Nunoshita, M. (Autor:in)


    Erscheinungsdatum :

    01.01.2001


    Format / Umfang :

    170068 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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