We have presented a design of silicon cantilever based scanning near-field optical microscopy (SNOM) probes with aluminum coated quartz tips which have been batch fabricated using micromachining technology. The 12 /spl mu/m high probe tips are made of SiO/sub 2/ and fabricated at the end of silicon cantilevers. A hole in the cantilever, located underneath the tip base, permits light insertion and collection through the cantilever. Transmission electron microscopy reveals a 60 nm thick polycrystalline aluminum layer that covers the tip entirely. Still, far-field measurements show the typical polarization properties of conventional SNOM aperture probes. In order to study the mechanism of light transmission through such a tip, theoretical modelling and several experiments were performed.


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    Title :

    Polarization properties of fully metal coated scanning near-field optical microscopy probes


    Contributors:
    Vaccaro, L. (author) / Aeschimann, L. (author) / Nakagawa, W. (author) / Eckert, R. (author) / Heinzelmann, H. (author) / Akiyama, T. (author) / Staufer, U. (author) / de Rooij, N.F. (author) / Herzig, H.P. (author)


    Publication date :

    2003-01-01


    Size :

    143200 byte





    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English





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