We performed characterization of boron nitride thin films made by femtosecond pulsed laser deposition. FT-IR and electron diffraction analysis indicated the content of wurtzite boron nitride phase, for the first time to our best knowledge.


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    Title :

    Characterization of Boron Nitride Thin Films Prepared by Femtosecond Pulsed Laser Deposition


    Contributors:
    Shimizu, T. (author) / Yoneyama, T. (author) / Sato, S. (author)


    Publication date :

    2005-01-01


    Size :

    524670 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English




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