We present a study of the aging properties of industrial 'cm-bar' arrays. Two issues are particularly addressed, namely the evolution of packaging-induced stress with operation time and the interplay between packaging-induced stress and the turn up of defects in the active region.
Aging properties of high-power diode laser arrays: relaxation of packaging-induced strains and corresponding defect creation scenarios
2005-01-01
929858 byte
Conference paper
Electronic Resource
English
Strain Relaxation and Defect Creation in High-Power Laser Diode Arrays
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