We present a study of the aging properties of industrial 'cm-bar' arrays. Two issues are particularly addressed, namely the evolution of packaging-induced stress with operation time and the interplay between packaging-induced stress and the turn up of defects in the active region.


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    Title :

    Aging properties of high-power diode laser arrays: relaxation of packaging-induced strains and corresponding defect creation scenarios


    Contributors:
    Tomm, J.W. (author) / Tien, T.Q. (author) / Oudart, M. (author) / Nagle, J. (author)


    Publication date :

    2005-01-01


    Size :

    929858 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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