We present a study of the aging properties of industrial 'cm-bar' arrays. Two issues are particularly addressed, namely the evolution of packaging-induced stress with operation time and the interplay between packaging-induced stress and the turn up of defects in the active region.


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    Titel :

    Aging properties of high-power diode laser arrays: relaxation of packaging-induced strains and corresponding defect creation scenarios


    Beteiligte:
    Tomm, J.W. (Autor:in) / Tien, T.Q. (Autor:in) / Oudart, M. (Autor:in) / Nagle, J. (Autor:in)


    Erscheinungsdatum :

    01.01.2005


    Format / Umfang :

    929858 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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