The growth of indium nitride quantum dots are studied. An investigation of the dot built-in strain, at the nanometric scale, performed using the synchrotron radiation is presented. These results are correlated with transmission electron microscopy images showing the dot structure. From these results, together with a thermodynamical analysis, it is shown that the dot growth mechanism is not the usual Stranski-Krastanov growth mode, but is more related to the BCF (Burton Cabrera Franck) growth mode.


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    Title :

    Growth and properties of indium nitride thin films and InN nanostructures


    Contributors:
    Briot, O. (author) / Ruffenach, S. (author) / Gil, B. (author)


    Publication date :

    2005-01-01


    Size :

    120163 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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