The growth of indium nitride quantum dots are studied. An investigation of the dot built-in strain, at the nanometric scale, performed using the synchrotron radiation is presented. These results are correlated with transmission electron microscopy images showing the dot structure. From these results, together with a thermodynamical analysis, it is shown that the dot growth mechanism is not the usual Stranski-Krastanov growth mode, but is more related to the BCF (Burton Cabrera Franck) growth mode.
Growth and properties of indium nitride thin films and InN nanostructures
2005-01-01
120163 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Growth and Properties of Indium Nitride Thin Films and InN Nanostructures
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