The growth of indium nitride quantum dots are studied. An investigation of the dot built-in strain, at the nanometric scale, performed using the synchrotron radiation is presented. These results are correlated with transmission electron microscopy images showing the dot structure. From these results, together with a thermodynamical analysis, it is shown that the dot growth mechanism is not the usual Stranski-Krastanov growth mode, but is more related to the BCF (Burton Cabrera Franck) growth mode.


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    Titel :

    Growth and properties of indium nitride thin films and InN nanostructures


    Beteiligte:
    Briot, O. (Autor:in) / Ruffenach, S. (Autor:in) / Gil, B. (Autor:in)


    Erscheinungsdatum :

    2005-01-01


    Format / Umfang :

    120163 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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