The growth of indium nitride quantum dots are studied. An investigation of the dot built-in strain, at the nanometric scale, performed using the synchrotron radiation is presented. These results are correlated with transmission electron microscopy images showing the dot structure. From these results, together with a thermodynamical analysis, it is shown that the dot growth mechanism is not the usual Stranski-Krastanov growth mode, but is more related to the BCF (Burton Cabrera Franck) growth mode.
Growth and properties of indium nitride thin films and InN nanostructures
01.01.2005
120163 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Growth and Properties of Indium Nitride Thin Films and InN Nanostructures
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