We investigate the wavelength dependence of the catastrophic optical damage current in 980 nm lasers. Using high pressure and low temperature techniques, we find an intrinsic dependence of this threshold on wavelength.


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    Title :

    Wavelength dependence of catastrophic optical damage threshold in 980 nm semiconductor diode lasers


    Contributors:
    Lock, D. (author) / Sweeney, S.J. (author) / Adams, A.R. (author)


    Publication date :

    2003-01-01


    Size :

    135204 byte





    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English





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