Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Wavelength Dependence of Catastrophic Optical Damage Threshold in 980nm Semiconductor Diode Lasers


    Contributors:

    Conference:

    Annual meeting; 16th, IEEE Lasers & Electro-optics Society; LEOS 2003 ; 2003 ; Tucson, AZ



    Publication date :

    2003-01-01


    Size :

    2 pages


    Remarks:

    IEEE cat. no. 03CH37460




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English





    High Power 980nm Lasers

    Yamaguchi, T. / IEEE | British Library Conference Proceedings | 2001


    Threshold Current as Acceleration Parameter for Degradation of 980nm Pump Lasers

    IEEE / Lasers and Electro-Optics Society | British Library Conference Proceedings | 1995