We report the use of electric-field-induced second-harmonic generation to investigate the electrical signal in CMOS chips with 2.3/spl mu/m femtosecond pulses. A linear relationship between the signal and applied voltage is found for voltages<1V.


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    Title :

    Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation


    Contributors:
    Dong Xiao, (author) / Ramsay, E. (author) / Reid, D.T. (author) / Offenbeck, B. (author) / Sundermeyer, J. (author) / Seemann, K. (author) / Weber, N. (author)


    Publication date :

    2005-01-01


    Size :

    231533 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English