We report the use of electric-field-induced second-harmonic generation to investigate the electrical signal in CMOS chips with 2.3/spl mu/m femtosecond pulses. A linear relationship between the signal and applied voltage is found for voltages<1V.
Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation
2005-01-01
231533 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
British Library Conference Proceedings | 2001
|British Library Conference Proceedings | 2003
|