We report the use of electric-field-induced second harmonic generation to investigate the electrical signal in a CMOS chip with 2.3 /spl mu/m femtosecond pulses. A linear relationship between the signal and electric field is found.
Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation
2005 Quantum Electronics and Laser Science Conference ; 2 ; 818-820 Vol. 2
01.01.2005
740484 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
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