A 3-baseline interferometer fourteen metrology gauges are used to monitor changes in the two baselines; calculate the length of the third. Simulation for estimating the third baseline indicates measurement capability better than 1 nm error.
Metrology system for space interferometry mission system testbed 3
Conference on Lasers and Electro-Optics, 2004. (CLEO). ; 1 ; 3 pp. vol.1
2004-01-01
377165 byte
Conference paper
Electronic Resource
English
6.0802 Space Interferometry Mission System Testbed-3: External Metrology Inversion
British Library Conference Proceedings | 2004
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