A 3-baseline interferometer fourteen metrology gauges are used to monitor changes in the two baselines; calculate the length of the third. Simulation for estimating the third baseline indicates measurement capability better than 1 nm error.


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    Title :

    Metrology system for space interferometry mission system testbed 3


    Contributors:


    Publication date :

    2004-01-01


    Size :

    377165 byte



    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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