This paper briefly describes the nanometer-class metrology system used in this testbed to estimate the length and orientation of the science baseline vector, which cannot be measured directly. The focus is on the mathematical inversion problem that results and its solution.


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    Title :

    Space Interferometry Mission System testbed-3: external metrology inversion


    Contributors:

    Publication date :

    2004-03-01


    Type of media :

    Preprint


    Type of material :

    No indication


    Language :

    English





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