While the optical properties as well as the DC-conductivity of thicker metal films are well understood, little has been done at and below the metal-to-insulator transition (percolation threshold), especially in the infrared and far-infrared region. Here we present temperature dependent FTIR measurements on ultra-thin Au films on Si(111) in the thickness range between about one monolayer and 9nm.


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    Title :

    Optical Properties of Ultra-thin Metal Films


    Contributors:
    Gompf, B. (author) / Brandt, T. (author) / Beister, J. (author) / Dressel, M. (author) / Drichko, N. (author)


    Publication date :

    2006-09-01


    Size :

    1255682 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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