While the optical properties as well as the DC-conductivity of thicker metal films are well understood, little has been done at and below the metal-to-insulator transition (percolation threshold), especially in the infrared and far-infrared region. Here we present temperature dependent FTIR measurements on ultra-thin Au films on Si(111) in the thickness range between about one monolayer and 9nm.
Optical Properties of Ultra-thin Metal Films
2006-09-01
1255682 byte
Conference paper
Electronic Resource
English
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