While the optical properties as well as the DC-conductivity of thicker metal films are well understood, little has been done at and below the metal-to-insulator transition (percolation threshold), especially in the infrared and far-infrared region. Here we present temperature dependent FTIR measurements on ultra-thin Au films on Si(111) in the thickness range between about one monolayer and 9nm.


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    Titel :

    Optical Properties of Ultra-thin Metal Films


    Beteiligte:
    Gompf, B. (Autor:in) / Brandt, T. (Autor:in) / Beister, J. (Autor:in) / Dressel, M. (Autor:in) / Drichko, N. (Autor:in)


    Erscheinungsdatum :

    01.09.2006


    Format / Umfang :

    1255682 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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