We need to focus on the exact cause of failure and perform prognostics during the test and repair cycle. Technology must change for test/diagnosis. With the advent of more robust microcircuits, we need to think “outside-the-box” when it comes to testing. If we continue to perform diagnostics in the same manner, without considering other testing philosophies, we will continue to waste time and resources.
What can we do to stay current with technology?
IEEE Aerospace and Electronic Systems Magazine ; 26 , 1 ; 35-39
2011-01-01
1880940 byte
Article (Journal)
Electronic Resource
English
What Can We Do To Stay Current with Technology?
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