We need to focus on the exact cause of failure and perform prognostics during the test and repair cycle. Technology must change for test/diagnosis. With the advent of more robust microcircuits, we need to think “outside-the-box” when it comes to testing. If we continue to perform diagnostics in the same manner, without considering other testing philosophies, we will continue to waste time and resources.


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    Title :

    What can we do to stay current with technology?


    Contributors:


    Publication date :

    2011-01-01


    Size :

    1880940 byte




    Type of media :

    Article (Journal)


    Type of material :

    Electronic Resource


    Language :

    English



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