We need to focus on the exact cause of failure and perform prognostics during the test and repair cycle. Technology must change for test/diagnosis. With the advent of more robust microcircuits, we need to think “outside-the-box” when it comes to testing. If we continue to perform diagnostics in the same manner, without considering other testing philosophies, we will continue to waste time and resources.


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    Titel :

    What can we do to stay current with technology?


    Beteiligte:
    Kirkland, L V (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    2011-01-01


    Format / Umfang :

    1880940 byte




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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