PROBLEM TO BE SOLVED: To provide a test device capable of shortening a test time of an operation management central device and achieving power saving in the test.SOLUTION: A test device 50 comprises: an inspection table data storage part 53 for storing inspection table data in which control procedures for simulating respective states of plural on-site apparatuses for setting a route of a train, and expectation values of control information when each of the plural on-site apparatuses is operated normally are associated in time series; and an inspection table output part 55 for, outputting simulation operation information for simulating apparatus operation information of each of the plural on-site apparatuses and described in the control procedures of the inspection table data to an operation management central device 10, and outputting an inspection table in which a state or value of each of the on-site apparatuses contained in the control information created on the operation management central device 10 based on the simulation operation information, is collated to the expectation value.SELECTED DRAWING: Figure 2

    【課題】運行管理中央装置の試験時間を短縮すると共に試験の省力化を図ることができる試験装置を得ること。【解決手段】試験装置50は、列車の進路を設定するための複数の現場機器の各々の状態を模擬するための制御手順と複数の現場機器の各々が正常に動作した場合における制御情報の期待値とが時系列順に対応付けられた検査表データを記憶する検査表データ記憶部53と、検査表データの制御手順に記され複数の現場機器の各々の機器動作情報を模擬した模擬動作情報を、運行管理中央装置10へ出力すると共に、模擬動作情報に基づいて運行管理中央装置10で生成される制御情報に含まれる複数の現場機器の各々の状態または値を期待値に照合した結果を記録した検査表を出力する検査表出力部55を備える。【選択図】図2


    Access

    Download


    Export, share and cite



    Title :

    TEST DEVICE AND TEST METHOD


    Additional title:

    試験装置および試験方法


    Contributors:
    IKARI KOKI (author)

    Publication date :

    2016-12-08


    Type of media :

    Patent


    Type of material :

    Electronic Resource


    Language :

    Japanese


    Classification :

    IPC:    B61L Leiten des Eisenbahnverkehrs , GUIDING RAILWAY TRAFFIC



    TEST DEVICE AND TEST METHOD

    KAI TERUMASA | European Patent Office | 2015

    Free access

    TEST DEVICE AND TEST METHOD

    TOSHIMA KAZUNARI / TSUSHIMA NOBUYUKI / MORIYA MITSUHARU et al. | European Patent Office | 2019

    Free access

    Test device, test method and flight test system

    ZHAO YANG / FANG MIN / CHEN KAI | European Patent Office | 2021

    Free access

    TEST DEVICE, TEST METHOD AND FLIGHT TEST SYSTEM

    ZHAO YANG / FANG MIN / CHEN KAI | European Patent Office | 2021

    Free access

    Drop test device, drop test system and drop test method

    LI TAO / GUO HANQING / ZHAO ZHE et al. | European Patent Office | 2022

    Free access