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    Title :

    Visual Scan Patterns of Expert and Cadet Pilots in VFR Landing


    Contributors:
    Diaz, Jose L. (author) / Bil, Cees (author) / Dyer, Adrian (author)

    Conference:

    17th AIAA Aviation Technology, Integration, and Operations Conference



    Publication date :

    2017-01-01




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English




    Visual Scan Patterns of Expert and Cadet Pilots in VFR Landing (AIAA 2017-3777)

    Diaz, Jose L. / Bil, Cees / Dyer, Adrian et al. | British Library Conference Proceedings | 2017




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