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    Title :

    Visual Scan Patterns of Expert and Cadet Pilots in VFR Landing (AIAA 2017-3777)


    Contributors:
    Diaz, Jose L. (author) / Bil, Cees (author) / Dyer, Adrian (author) / Garcia, Jair E. (author)

    Conference:

    Aviation technology, integration and operations ; 2017 ; Denver, CO



    Publication date :

    2017-01-01


    Size :

    11 pages


    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English



    Visual Scan Patterns of Expert and Cadet Pilots in VFR Landing

    Diaz, Jose L. / Bil, Cees / Dyer, Adrian | AIAA | 2017




    Nr. 3777

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