Equivalent Properties of Single Event Burnout in Power MOSFET Induced by Heavy Ion and 252Cf Fission Fragment
57th International Astronautical Congress ; 2006 ; Valencia , Spain
2006-01-01
Conference paper
Electronic Resource
English
Effect of Charge Distribution on Burnout Threshold of Hardened Power MOSFET
British Library Conference Proceedings | 2000
|Experimental studies of single-event gate rupture and burnout in vertical power MOSFET's
Tema Archive | 1996
|Discussions on Worst-Case Test Condition for Single Event Burnout
British Library Conference Proceedings | 2011
|