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    Title :

    Equivalent Properties of Single Event Burnout in Power MOSFET Induced by Heavy Ion and 252Cf Fission Fragment


    Contributors:
    Cao, Zhou (author) / Yang, Shiyu (author) / Xue, YuXiong (author) / Da, Daoan (author)

    Conference:

    57th International Astronautical Congress ; 2006 ; Valencia , Spain



    Publication date :

    2006-01-01




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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