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    Title :

    Reliability Assessment for Complicated Electronic Equipment with Virtual Samples of Accelerated Degradation Tests


    Contributors:
    Xu, Y. (author) / Chen, X. (author) / Sun, J. (author) / Liu, R. (author) / Fan, H. (author)

    Published in:

    Publication date :

    2013-01-01


    Size :

    6 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    Unknown


    Classification :

    DDC:    500



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