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    Title :

    Terahertz reflectometry images faults in silicon chips


    Contributors:
    Nagel, M. (author) / Kurz, H. (author)

    Published in:

    LASER FOCUS WORLD ; 47 , 11 ; 61-64


    Publication date :

    2011-01-01


    Size :

    4 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    621.366



    Phase-sensitive time-domain terahertz reflectometry

    Pashkin, A. / Kadlec, F. / Nemec, H. et al. | IEEE | 2004




    Fault Location on Silicon Chips

    British Library Online Contents | 1998


    Opportunities for Optics to Silicon Chips

    IEEE Lasers and Electro-optics Society | British Library Conference Proceedings | 2005