We review a recently developed method for measuring the terahertz reflectivity able to provide correctly both the amplitude and the phase of terahertz radiation reflected from the sample. Thus it is possible to evaluate the complex optical constants of opaque materials including crystals, ceramics and thin films.


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    Title :

    Phase-sensitive time-domain terahertz reflectometry


    Contributors:
    Pashkin, A. (author) / Kadlec, F. (author) / Nemec, H. (author) / Kuzel, P. (author)


    Publication date :

    2004-01-01


    Size :

    144821 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English




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