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    Title :

    Correlation of Scattering Loss, Sidewall Roughness and Waveguide Width in Silicon-on-Insulator (SOI) Ridge Waveguides


    Contributors:
    Yap, K.P. (author) / Delage, A. (author) / Lapointe, J. (author) / Lamontagne, B. (author) / Schmid, J.H. (author) / Waldron, P. (author) / Syrett, B.A. (author) / Janz, S. (author)

    Published in:

    Publication date :

    2009-01-01


    Size :

    3999 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    621.3692





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