Correlation of Scattering Loss, Sidewall Roughness and Waveguide Width in Silicon-on-Insulator (SOI) Ridge Waveguides
JOURNAL OF LIGHTWAVE TECHNOLOGY ; 27 , 17/20 ; 3999
01.01.2009
3999 pages
Aufsatz (Zeitschrift)
Englisch
DDC: | 621.3692 |
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Online Contents | 2005
|Oxidation Smoothing of Sidewall Roughness in AlGaAs Heterostructure Waveguides
British Library Conference Proceedings | 2005
|British Library Online Contents | 2009
|