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    Title :

    Scanning probe microscopy for testing ultrafast electronic devices


    Contributors:
    Hou, A. S. (author) / Nechay, B. A. (author) / Ho, F. (author) / Bloom, D. M. (author)


    Publication date :

    1996-01-01


    Size :

    24 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    537.5



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