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    Title :

    Ultrafast Scanning Probe Microscopy


    Contributors:
    Weiss, S. (author) / Bolkin, D. (author) / Ogletree, D.F. (author) / Salmeron, M. (author) / Chemla, D.S. (author)


    Publication date :

    1993-01-01


    Size :

    179341 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    Ultrafast Scanning Probe Microscopy

    IEEE; Lasers and Electro-Optics Society / IEEE; Microwave Theory and Techniques Society | British Library Conference Proceedings | 1993


    Progress in ultrafast scanning probe microscopy

    Weiss, S. / Botkin, D. / Ogletree, D.F. et al. | IEEE | 1994


    Progress in Ultrafast Scanning Probe Microscopy

    IEEE; Lasers and Electro-Optics Society | British Library Conference Proceedings | 1994


    Scanning probe microscopy for testing ultrafast electronics

    Hou, A.S. / Nechay, B.A. / Ho, F. et al. | IEEE | 1995


    Scanning probe microscopy for testing ultrafast electronic devices

    Hou, A. S. / Nechay, B. A. / Ho, F. et al. | British Library Online Contents | 1996