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    Title :

    Automatic Test Case Generation for Safety-Related Embedded Systems



    Conference:

    WORLD CONGRESS, Society of Automotive Engineers ; 2008 ; Detroit, MI



    Publication date :

    2008-01-01


    Size :

    2008-01-0114-2008-01-0116


    Remarks:

    SAE 2008-01-0001 - 2008-01-0146 held with gaps



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English





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