Automatic Test Case Generation for Safety-Related Embedded Systems
WORLD CONGRESS, Society of Automotive Engineers ; 2008 ; Detroit, MI
2008-01-01
2008-01-0114-2008-01-0116
SAE 2008-01-0001 - 2008-01-0146 held with gaps
Aufsatz (Konferenz)
Englisch
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Automatic Test Case Generation for Safety-Related Embedded Systems
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