Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Automatic Test Case Generation for Safety-Related Embedded Systems



    Kongress:

    WORLD CONGRESS, Society of Automotive Engineers ; 2008 ; Detroit, MI



    Erscheinungsdatum :

    2008-01-01


    Format / Umfang :

    2008-01-0114-2008-01-0116


    Anmerkungen:

    SAE 2008-01-0001 - 2008-01-0146 held with gaps



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch





    Automatic test case generation for safety-related embedded systems

    Daemon,P. / Magna Steyr,AT | Kraftfahrwesen | 2008


    2008-01-0114 Automatic Test Case Generation for Safety-Related Embedded Systems

    Damon, P. | British Library Conference Proceedings | 2008


    Semi-automatic reliability assessment of safety related embedded systems

    Kucera, Markus / Mauser, Hans | Tema Archiv | 2006


    Model-based automatic test case generation for automotive embedded software testing

    Shin, K. W. / Lim, D. J. | British Library Online Contents | 2018