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    Title :

    2008-01-0114 Automatic Test Case Generation for Safety-Related Embedded Systems


    Contributors:
    Damon, P. (author)

    Conference:

    SESSION, Safety-critical systems ; 2008 ; Detroit, Mich


    Published in:

    SAE SP ; 2173


    Publication date :

    2008-01-01


    Size :

    8 pages


    Remarks:

    Held during the SAE 2008 world congress



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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