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    Title :

    FA3-1 KEYNOTE ADDRESS: Backside Observation of MOSFET Chips using an Infrared Laser Terahertz Emission Microscope


    Contributors:

    Conference:

    30th, International conference on infrared and millimeter waves; IRMMW-THz 2005 ; 2005 ; Williamsburg, VA



    Publication date :

    2005-01-01


    Size :

    2 pages


    Remarks:

    Includes bibliographical references and index



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Backside observation of MOSFET chips using an infrared laser THz emission microscope

    Yamashita, M. / Nikawa, K. / Tonouchi, M. et al. | IEEE | 2005


    Laser Terahertz Emission Microscope

    Tonouchi, Masayoshi | IEEE | 2006



    Laser Terahertz Emission Microscope and Its Application

    IEEE Lasers and Electro-optics Society | British Library Conference Proceedings | 2005


    Keynote Address

    WICKENS, ALAN | Taylor & Francis Verlag | 1998