Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    In-situ OTDR Measurements for Single-Mode Optical Networks with a Standard VCSEL



    Conference:

    Annual Meeting; 17TH, IEEE Lasers & Electro-optics Society:; LEOS 2004 ; 2004 ; Rio Grande, Puerto Rico



    Publication date :

    2004-01-01


    Size :

    2 pages


    Remarks:

    IEEE cat. no. 04CH37581




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    In-situ OTDR measurements for single-mode optical networks with a standard VCSEL

    Keeler, G.A. / Serkland, D.K. / Geib, K.M. et al. | IEEE | 2004


    Nanoscale optical measurements of VCSEL transverse mode structure

    Hong, Y. / Cambridge, J.A. / Shore, K.A. et al. | IEEE | 2001


    Nanoscale Optical Measurements of VCSEL Transverse Mode Structure

    Hong, Y. / Cambridge, J. A. / Shore, K. A. et al. | British Library Conference Proceedings | 2001



    Accuracy of optical component reflectance measurements using an OTDR [2611-23]

    Poudyal, V. / Reith, L. A. / Vogel, E. M. et al. | British Library Conference Proceedings | 1996