Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Soft Defect Localization (SDL) in Integrated Circuits using Laser Scanning Microscopy


    Contributors:

    Conference:

    Annual meeting; 16th, IEEE Lasers & Electro-optics Society; LEOS 2003 ; 2003 ; Tucson, AZ



    Publication date :

    2003-01-01


    Size :

    2 pages


    Remarks:

    IEEE cat. no. 03CH37460




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Soft defect localization (SDL) in integrated circuits using laser scanning microscopy

    Bruce, M.R. / Bruce, V.J. / Eppes, D.H. et al. | IEEE | 2003


    Thermal laser stimulation for direct localization of defects in integrated circuits

    Beaudouin, F. / Desplats, R. / Perdu, P. et al. | British Library Conference Proceedings | 2002


    Modeling "Soft" Errors in Bipolar Integrated Circuits

    Zoutendyk, J. / Benumof, R. / Vonroos, O. | NTRS | 1985



    Laser Signal Injection Microscopy of Si Integrated Circuits with a Numerical Aperture Increasing Lens

    IEEE Lasers and Electro-optics Society | British Library Conference Proceedings | 2005