Soft Defect Localization (SDL) in Integrated Circuits using Laser Scanning Microscopy
Annual meeting; 16th, IEEE Lasers & Electro-optics Society; LEOS 2003 ; 2003 ; Tucson, AZ
2003-01-01
2 pages
IEEE cat. no. 03CH37460
Conference paper
English
lasers , electro-optics , IEEE , LEOS
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Thermal laser stimulation for direct localization of defects in integrated circuits
British Library Conference Proceedings | 2002
|Modeling "Soft" Errors in Bipolar Integrated Circuits
NTRS | 1985
|British Library Conference Proceedings | 2005
|