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    Title :

    SiC Device Characterization for HEV's


    Contributors:

    Conference:

    Workshop; 7th, Power electronics in transportation ; 2002 ; Auburn Hills, MI



    Publication date :

    2002-01-01


    Size :

    6 pages


    Remarks:

    IEEE cat no 02TH8625



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English






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