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    Title :

    Reliability of integrated circuits modified by focused ion beam for space applications


    Contributors:

    Conference:

    European space components conference ; 2002 ; Toulouse, France



    Publication date :

    2002-01-01


    Size :

    10 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Reliability of integrated circuits modified by focused ion beam for space applications

    Desplats, R. / Courrege, J.C. / Benteo, B. et al. | Tema Archive | 2002


    High reliability circuits for space applications

    Gregoris, G. | Tema Archive | 1995



    Study on the method for the reliability test of focused ion beam

    Lee, S. H. / Kang, H. W. / Cho, D. W. et al. | British Library Online Contents | 2007