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    Title :

    DUV or EUV: that is the question [4146-01]



    Conference:

    Conference, Soft x-ray and EUV imaging systems ; 2000 ; San Diego, CA



    Publication date :

    2000-01-01


    Size :

    12 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Nr. 4146

    DataCite | 1925


    High-resolution soft x-ray microscopy [4146-24]

    Chao, W. / Anderson, E. H. / Denbeaux, G. et al. | British Library Conference Proceedings | 2000


    Portable diagnostics for EUV light sources [4146-13]

    Stuik, R. / Constantinescu, R. C. / Hegeman, P. et al. | British Library Conference Proceedings | 2000


    Illumination optics design for EUV lithography [4146-03]

    Antoni, M. / Singer, W. / Schultz, J. et al. | British Library Conference Proceedings | 2000


    Multilayer reflectance during exposure to EUV radiation [4146-07]

    Oestreich, S. / Klein, R. / Scholze, F. et al. | British Library Conference Proceedings | 2000