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    Title :

    Reliability of lithium niobate Annealed Proton Exchanged integrated optical circuits [2481-14]


    Contributors:

    Conference:

    Meeting, Photonic device engineering for dual-use applications ; 1995 ; Orlando; FL



    Publication date :

    1995-01-01


    Size :

    6 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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