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Halbleitertechnologie
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keywords:(Halbleitertechnologie)
20m Cutoff Long-Wavelength In~xGa~1~-~xAs/GaAs Quantum-Well Infrared Photodetectors
Absolute high-accuracy deflectometric measurement of topography [5188-39]
Accuracy of optical thin film parameter determination based on spectrophotometric data [5188-24]
Activated lithium tetraborate and calcium sulphate in radiation dosimetry [3179-46]
Advanced transmission electron microscopy for nano-optics (Invited Paper) [5188-28]
AgBr microcrystals studied by scanning tunneling microscopy [3179-31]
A review of the emerging SEMI standards for particle scanners [5188-48]
Artifically Structured Materials for Opto-electronics Devices
At-wavelength metrology on Sc-based multilayers for the UV and water window [5188-17]
Band Structure and Optical Gain of 1.3 um GaAsSbN/GaAs Compressively Strained Quantum Well Laser
Barrier-Doped GaAs/AlGaAs Quantum Well Detector
Beryllium doping in Al~0~.~5Ga~0~.~5As MBE layers