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    Titel :

    Advanced transmission electron microscopy for nano-optics (Invited Paper) [5188-28]



    Kongress:

    Annual conference, Advanced characterization techniques for optics, semiconductors, and nanotechnologies



    Erscheinungsdatum :

    2003-01-01


    Format / Umfang :

    15 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Photothermal microscopy and laser damage in optical components (Invited Paper) [5188-22]

    Commandre, M. J. / Natoli, J. Y. / Amra, C. et al. | British Library Conference Proceedings | 2003


    Optimization of optical coatings for the UV/VUV range (Invited Paper) [5188-11]

    Ristau, D. / Gunster, S. / International Society for Optical Engineering | British Library Conference Proceedings | 2003


    Characterizing surface roughness of thin films by polarized light scattering (Invited Paper) [5188-33]

    Germer, T. A. / Fasolka, M. J. / International Society for Optical Engineering | British Library Conference Proceedings | 2003


    Characterization of polarization aberrations in liquid crystal devices (Invited Paper) [5188-01]

    Wolfe, J. / Chipman, R. / International Society for Optical Engineering | British Library Conference Proceedings | 2003


    Comparison of roughness measurement with atomic force microscopy and interference microscopy [5188-49]

    Kuhle, A. / Rosen, B.-G. / Garnaes, J. et al. | British Library Conference Proceedings | 2003